hi
i am trying to oversample ads8517 adc ic to get high resolution result basically i am trying to implement a adc and dac calibration system i have seen delta sigma adc but sample rate is very slow and accuracy is second issue so i came across this adc have better accuracy with built in voltage reference and different volt measurement options like
4-V, 5-V, and ±10-V Input Ranges with High-Impedance Input
at this point my question is
after oversampling what would be INL and DNL and how to calibrate enhanced adc result to get ideal performance and calibration of temperature drift my target is to get 22 or 20 noise free bits of data so the output data rate will remain maximum i have seen different oversampling schemes one is white noise second is dithering method to add triangular noise in input signal or vref of adc with compare to white noise dithering gives faster update rate
in my this application how to use oversample dithering method what would be suitable circuit if i chose to add triangular noise to Vref i cannot add triangular noise to input circuit because i decided when ever i am going to calibrate other adc using this calibrator so signal will be feed to both adc's inputs with single buffer to see the difference
this adc have 16-bits native structure and addition of 4 more bits it requires 32 samples data to get 20 bit result (6250 samples/sec faster then any delta sigma adc) and for 6 more bits 128 samples data to get 22 bit resolution(1562 samples/sec faster then any delta sigma adc) using dithering method so what will be proper scheme of dithering noise and sampling of data for 0 to 4 volt measurement , for 0 to 5 volt measurement and for 0 to +/-10 volt volt measurement range to get 20 bit result and 22 bit result measurement range
regards
Shams iqbal