Other Parts Discussed in Thread: DLP9500, DLPC410, DLP9000X,
We are currently using the DLPC410 combined with the DLP9500 DMD.
The board that integrate the DLPC , DLPR and DLPA chips is going through several tests.
The final test is what we call "functional" test , simulates actual work conditions.
In this test the board is connected to and actual DLP9500 , mirrors patters are generated and optically observed.
We are designing two new boards:
1. A new version that uses DLPC410 combined with the DLP9500 DMD.
2. A new board will incorporate the DLPC910 chip and will work with the DLP9000x DMD.
I am looking for an electronic testing solution for the new boards.
Ideally I would like to design/purchase a board measuring the LVDS and reset lines that are generated by the DLPC and the DLPA chips.
From what I know the DLPC and the DLP uses a serial protocol that is not disclosed , in order to identify and work.
Maybe I can purchase a unit/chip instead of the DLP that can tell the DLPC to generate some test pattern?
Or some other solution?
Thank you very much for the help,