Due to the U.S. Thanksgiving holiday, please expect delayed responses during the week of 11/22.

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

DLPC910: Functional test of the DLPC410 and future support of the DLPC910

Part Number: DLPC910
Other Parts Discussed in Thread: DLP9500, DLPC410, DLP9000X,

Hello,

We are currently using the DLPC410 combined with the DLP9500 DMD.

The board that integrate the DLPC ,  DLPR and DLPA chips is going through several tests.

The final test is what we call "functional" test , simulates actual work conditions.

In this test the board is connected to and actual DLP9500 , mirrors patters are generated and optically observed.

We are designing two new boards:

 1. A new version that uses DLPC410 combined with the DLP9500 DMD.

 2. A new board will incorporate the DLPC910 chip and will work with the DLP9000x DMD.

I am looking for an electronic testing solution for the new boards.

Ideally I would like to design/purchase a board measuring the LVDS and reset lines that are generated by the DLPC and the DLPA chips.

From what I know the DLPC and the DLP uses a serial protocol that is not disclosed , in order to identify and work.

Maybe I can purchase a unit/chip instead of the DLP that can tell the DLPC to generate some test pattern?

Or some other solution?

Thank you very much for the help,

Dima

  • Hello Dima,

    These two controllers are binary level FPGA based controllers and do not have any patterns built in to call.  All patterns have to be generated and provided to the controller.  Am I understanding your intent correctly?

    Fizix