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THVD2410: THVD2410 70V bus fault

Part Number: THVD2410

Pins A and B input 24V voltage, chip pins will burn out,

What is the maximum voltage that A\B pin can input?

  • Hi User,

    The bus pins for this device can withstand up to +-70V applied to them with respect to device ground. If the device is driving the bus while such a short is applied, the short-circuit output current will be internally limited to avoid damaging the device. The device will remain operational as long as the bus conditions remain within the recommended range of +-25V. Once this range is exceeded, functionality during the fault cannot be guaranteed, but the device will not be damaged until the absolute maximum range is exceeded. 

    Have you experienced a damaged device due to a fault test? If so, I would be interested in learning more about your test setup to identify what might be causing this failure. 

    Eric Schott

  • Hi Eric

    Similar situation happened in my customer side. They add 24V in PIN A and found the part been damaged.

    They tie RE and DE together and the MCU output high level to both of it. It means that this device is in driver mode.

    I am intresting about how we limit the short circuit current when the tranciver operate as a driver. 

    The maximum voltage level we could handle during driver being short is +/-25V? 

    What's the data condition for this spec? (I suppose the maximum voltage spec is different when we are sending the data through D pin, and certain duty cycle will making the short current follow through different FET. But if we add constant level in D pin the short current will only follow through one internal FET)

  • Hi Gabriel,

    The test conditions for the specification of this and other devices is outlined in this document. Section 2.2.5 details the short-circuit output current setup. 

    Could you share the test circuit your using?

    • What board is bing used and what passive components are included (capacitance, termination and series resistances, TVS diode or other protection)?
    • How was the fault voltage applied (power supply, connected manually or switched on after connection)?
    • How long was the fault applied for before failure was recognized?
    • Is it possible to measure the input current (through Vcc) of the device after damage is suspected? 
    • Lastly, could you share the markings on top of the device? All of the numbers/letters or a picture of them will do. 

    Eric Schott

  • Eric

    The issue have been solved. Customer install the wrong sample to their prototype. 

    After replace the right part all the test result is within our expectation. Thanks.

  • Hi Gabriel,

    I'm glad to hear that the issue has been resolved. I'll close this thread. 

    Eric Schott