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TCAN1043G-Q1: Differential capacitance measurement

Part Number: TCAN1043G-Q1

Hi,

Is it recommended to test the differential capacitance according to ISO 11898-2 chapter 6.6 "Input Capacitances"?

I am asking this question because in our HW validation tests we used this method on TCAN1043g - q1 device but obtained very bad results (over 70 pf Cdiff). On the same PCB/same layout we used an NXP transceiver and obtained (using ISO method) ~20 pf for Cdiff.

What do you recommend in this situation? at data-sheet level TCAN Cdiff should be only larger by 5pf compared to NXP device.

  • Veniamin,

    There are a few issues with the ISO method including not accounting for internal resistance when calculating the capacitances, not defining the frequency of the waveform injected into the CAN bus, and the formulas are incorrect. If you email me directly at e-hackett@ti.com I can provide a presentation for a more reliable method.

    Regards,

    Eric Hackett