Hi,
Is it recommended to test the differential capacitance according to ISO 11898-2 chapter 6.6 "Input Capacitances"?
I am asking this question because in our HW validation tests we used this method on TCAN1043g - q1 device but obtained very bad results (over 70 pf Cdiff). On the same PCB/same layout we used an NXP transceiver and obtained (using ISO method) ~20 pf for Cdiff.
What do you recommend in this situation? at data-sheet level TCAN Cdiff should be only larger by 5pf compared to NXP device.