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ESD441: Leakage Current

Part Number: ESD441

Hello,

I have some questions about ESD441's leakage current.

  • The data sheet has the leakage current specs (Typ and Max values) under the condition of VIO = 5.5 V, but are the Typ/Max specs available under different conditions of VIO = 0.1, 1, 2, and 3 V?
  • What's the VIO condition of Figure 6-7 in the data sheet?
  • What are the conditions when the leakage current goes up to the Max value of 50 nA?
    • From the Figure 6-7, the ILEAK changes over temperatures are not so significant.

Best regards,
Shinichi Yokota

  • Hi Shinichi, 

    For our devices, the leakage current specs are under the condition of VIO = working voltage (VRWM). Specifically to ESD441, this would be VIO = 5.5V.

    • Figure 6-7 has VIO = 5.5V
    • To see the leakage current under different conditions then the IV curve would be the best option. This is a sweep from 0 to 5.5 V and records the leakage current and also shows the increase in leakage at breakdown. 

    Please let me know if you have additional questions. 

    Best regards, 

    McKenzie Eaker

  • Kenzie,

    • To see the leakage current under different conditions then the IV curve would be the best option. This is a sweep from 0 to 5.5 V and records the leakage current and also shows the increase in leakage at breakdown.

    I guess the DC I-V Curve (Figure 6-9) in the data sheet contains the information I requested, but could you share with me the data in numbers?

    • What are the conditions when the leakage current goes up to the Max value of 50 nA?
      • From the Figure 6-7, the ILEAK changes over temperatures are not so significant.

    I guess the Max value 50 nA is not a temperature variation but a process one. Is it correct?

    Best regards,
    Shinichi Yokota

  • Hi Shinichi, 

    Yes, the raw data shows:

    VIO = 0.1V -> leakage current = 0.015 nA

    VIO = 1V -> leakage current = 0.2 nA

    VIO = 2V -> leakage current = 0.5 nA

    VIO = 3V -> leakage current = 0.8 nA

    The max value is set by the design/validation team. It is not likely the device will reach max leakage under normal operating conditions. Once breakdown occurs then the leakage current will increase above the 50 nA max. 

    Please let me know if you have more questions/comments. 

    Best regards, 

    McKenzie

  • McKenzie,

    Thanks for the raw numbers.

    The max value is set by the design/validation team. It is not likely the device will reach max leakage under normal operating conditions. Once breakdown occurs then the leakage current will increase above the 50 nA max.

    I know and I don't ask about it. I don't ask about a breakdown, either.

    I know that distribution data is taken during validation process and the specs are decided based on it by taking into account ±3σ, ±6σ, or whatever. If I take a look at Figure 6-7 of the data sheet, the temperature variation looks much smaller than the data sheet specs of 50 nA and I don't think the specs are determined by the temperature changes. Therefore, I suspect that a process variation is larger than the temperature one and the Max specs of 50 nA is ;determined by it.

    Could you check it again with your team?

    Best regards,
    Shinichi Yokota

  • Hi Shinichi, 

    I talked with our validation team about this. This is what they told me:

    There is no process variation for our devices. It is a proven voltage node, and our distribution is extremely tight. At 25C, our leakage does not exceed 1nA for majority of our devices and at higher temps, the leakage may increase but on the lower side (never reaching 50nA). 

    Hopefully this clears it up. Please let me know if you have additional questions. 

    Best Regards, 

    McKenzie

  • McKenzie,

    Thanks. Now I understand that the Max ILEAK spec of 50 nA is defined with a plenty of margins.

    Best regards,
    Shinichi Yokota