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DS90CR286A: Phenomenon where unexpected pulses are output to the output of DS90CR286A

Guru 10395 points
Part Number: DS90CR286A

Hi, 

During the shipping test, one out of 100 units had an issue where it did not pass the aging test. When we checked the signal on an oscilloscope, we discovered that it was outputting an unexpected pulse and that this was the reason for it not passing the test. Specifically, a whisker-like pulse is occurring on the output of pin 37 (RxOUT09) of the DS90CR286AMTD/NOPB.

We also performed an A-B-A swap and it did not reproduce with other chips. Since this is a problem with 1/100 pcs, there is a possibility that the problem depends on a specific chip, but is it possible to receive any comments on possible causes?

Thanks,

Conor

  • Hi Conor,

    Can you provide more information about the test which was failed?

    Regards,

    Ben

  • Hi Ben,

    An aging test evaluates heat resistance and durability by applying a constant current to an IC for a long time at an appropriate temperature. During this inspection, an unexpected pulse is output, causing the test to fail. However, this problem occurs in only one IC, and the problem probability is 1% (1/100 pcs). Since this pulse is not specified in the data sheet, is there a high possibility of random failure?

    Thanks,

    Conor

  • Hi Conor,

    Since this pulse is not specified in the data sheet, is there a high possibility of random failure?

    I am not sure quite yet. I will need to look into this more.

    In the meantime, can you please let me know if the device is powered during this test? Is there any input to the device? Also, what temperatures are being tested?

    Regards,

    Ben