SN65HVD233-HT: Failing at 185 and 190C

Hi Stephen,

I'm gathering information on the previous thread to see if we found a solution. I will give you an update later today based on what I find.

Regards,
Eric

Hi Stephen,

I was able to trace some internal communications regarding the previous E2E thread, but I was not able to find if the issue was resolved. Luckily the information I can access elaborates more on the testing that was done. Would you be able to provide more information on your testing so that we can see if this may be a similar occurrence?

1. At what time and temperature during the test does the failure occur?
2. In what way does the device fail? - If there is a communication failure, would you be able to share scope shots of the CAN bus being driven by the failed part?
3. How many devices have failed the test? - Are the failure results repeatable and if so at what rate?
4. Do other devices in the system fail as well? - Other ICs, traces, passive components, etc. Could any of this cause a transient or surge event?
5. What other devices are connected to SN65HVD233 during the test? - Is communication present during the test? Could you share a schematic?
6. Could you share the marking that are on the top of the failed device(s)?

Regards,
Eric

Hi Stephen,

Were you able to find a solution for the SN65HVD233-HT failure at high temp?

Regards,
Eric