TUSB214: Short circuit test

Hi Jeffery,

Can you give me more details about the customers failure? I will see if we have this information available. 

Hi Malik,

The short failure of TUSB214 was found on the curve trace analysis like attached pdf below. So my customer requested the short circuit test or measurement document to find the root cause and improve their design. Please check it and let me know.

Short failure.pdf

Regards,

Hi Jeffrey,

Unfortunately, I do not have curve trace data here however results provided seem abnormal, is this seen across multiple devices? To clairfy this is shrt is seen between Pin 10, 7, 8, and 12 together?

Hi Malik,

Please refer to my answers below.

Is this seen across multiple devices? Yes, this failure was found by TI CQE on curve trace analysis, and there was same symptom in multiple devices.

To clarify this is short is seen between Pin 10, 7, 8, and 12 together? Yes, the short failure was observed between GND(Pin 10) and D2P(Pin 7)/D2M(Pin 8)/VCC(Pin 12).

I think that VCC was shorted to D2P/D2M or GND by external cause.

Please let me know the short circuit test or measurement data of this device.

Regards,

Hi Jeffery,

I am looking into this and will get back to you by Friday.

Hi Jeffery,

This result does appear abnormal to similar data of a good unit. Unfortunately I cannot post it here,. It seems that the data of the returned units in your report may have experienced some external cause such as electrical overstress. Customer should ensure there is no other device is driving the pins of TUSB214 while the device is unpowered.