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TPD2E2U06-Q1: Inquiry about ESD diode burnt phenomenon of USB data line.

Part Number: TPD2E2U06-Q1

Hi TI experts,

The ESD diode of the USB data line is destroyed. We know that external damaged items cannot be analyzed for defects.

This is a line with no possibility of generating a surge voltage.

I want to know the cause of the ESD diode destruction in the usb data line. Please let me know if you have any of your experiences or possible causes.


Downey Kim.

  • Hi Downey,

    I'm sorry to hear that you are having issues with these devices. To get a better understanding of what might have caused these failures, I have a few follow up questions:

    1. When the devices failed, did it result in a short-to-ground or open? 

    2. When the failures were observed, was it during normal operation, or was this during some sort of system level stress test? If normal operation, was there any system level stress test done before hand? Basically, what was happening/had been done when the failures were observed? 

    3. Why are there 2 diodes in parallel on each line? Normally, you should only have one ESD diode per line. 

    4. Are there any voltages on or near the protected lines that would go above 5 V?

    5. How many times do these failures occur? Is it always on the same lines?

    Let me know if I need to clarify any of these questions. Looking forward to getting to the bottom of this!


    Matt Smith