Hello,
Regarding to compliance test with DP83822 EVM, my customer is asking a question.
They are doing 10Base-Te TP_IDL compliance test on EVM, but some test is failed.
(Please refer below.)
・10 Base-Te, TP_IDL Template, with TPM (last bit CD0), Load: load3 (red part: Failed)
・10 Base-Te, TP_IDL Template, without TPM (last bit CD0), Load: load1 (red part: Failed)
I think that the failure cause will be jitter on signal.
They have referred test procedure and script on Application Report(SANLA266).
I attached compliance all test report.
(Question)
They are wondering why TP_IDL test is failed on EVM.
Is there other causes on test procedure or setup?
Could you please give any advice or comment?
Regards,
Tao 2199