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ISO7763-Q1: the damaged time when input high, output is short

Part Number: ISO7763-Q1


The functional safety application notes descried“  Device damage possible if INE is driven high for extended period of time.” The customer need to know how long is the period time which caused the IC damaged.

Best regards


  • Hi Kailyn,

    Thanks for reaching out.

    When the output OUTE is stuck LOW and the input INE is driven HIGH then it is possible that the output forced to HIGH and LOW together causing a VCC/GND short. The length of time for such VCC/GND short really depends on the customer application and the current limit of power supply connected to respective VCC. Since we do not characterize for these test conditions, I do not have any guaranteed data to give it to you. But I wouldn't expect this to last long, the device could damaged in a few seconds to a few mins.

    I hope that answers your question, thanks.

    Koteshwar Rao