Dears,
Our customer uses ISO7741FDW for EFT test, but the result is that the input FAU_A has no low level,but the output FAULT_A of ISO7741F has about 1us high level .Below is his test setup and waveform. Could you please give me some advice?Thank you
Best regards
Kailyn
sorry for the late reply.
Previously purchased TI's ISO7741FDW chip, we are now applied to the SiC driver board, but encountered some problems in the pulse group (EFT) experiment, trouble to help analyze, thank you.
The figure below is the block diagram of the corresponding part.
When doing EFT, the measured waveforms are as follows.
1. Primary side FAULT_A (3 channels) and corresponding gate output (2 channels)
2. Secondary side FAU_A (3 channels) and corresponding gate output (2 channels)
3. Primary side 3.3V power supply (3 channels) and corresponding gate output (2 channels)
4. Secondary 5V power supply (3 channels, relative to the gate ground, the chip ground is -2V relative to the gate) and the corresponding gate output (2 channels)
5. Primary side enable (3 channels) and corresponding gate output (2 channels). The enable signal terminal is pulled up to the power supply through a resistor
As can be seen from the above figures, the signal FAU_A transmitted to ISO7741F is not pulled low at EFT, but FAULT_A from ISO7741F appears low for a period of time. What is the cause of this problem? ? I haven't found the reason yet, so I would like to ask.
