Other Parts Discussed in Thread: TPD1E10B06, ISO7741
Please reference QEM-CCR-1809-00743 FA report figure 8, Customer like to know which area part will be damage, RD need to know it for Solve hidden problems, thanks !
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Please reference QEM-CCR-1809-00743 FA report figure 8, Customer like to know which area part will be damage, RD need to know it for Solve hidden problems, thanks !
Thanks James!
To prevent transient voltages from damaging the Vcc pins 5V TVS diode clamps can be used in parallel with CP31 and CP44. This is the preferred solution. Zener diode clamps may also be used, but TVS diodes respond quicker for fast transients.
Below are two general comments on the schematic:
1. It is unusual for enable pins to be left floating. They should be pulled up to Vcc with a 4.7kOhm resistor if output enable is desired or pulled low to GND to make the output pins on each side high impedance.
2. a 1uF capacitor can help the ISO device respond to sudden load changes in addition to the 0.1uF caps on Vcc. A sketch of this solution is pictured below:
Is the customer finding these failed devices in tests or randomly during normal operation?
Please respond if this is helpful.
Thank you for your time,
Manuel Chavez
Thanks. We still get some stress from customer site about this failure issue since we doesn't explain it more detail.
Could you point out that where the circuitry/ESD I/O diode are possibly damaged on the die depends on the FA report? customer would like to know more detail to investigate it and prevent it in the future. Please advice. thanks.