Part Number: ISO7763-Q1
My customer have the following questions.
1.Please tell me what the graph in the upper on the right (within the blue frame below) of Fig.4 of slyy064.pdf represents.
The graph in the middle is described in the material ( The typical duration of a burst is 15 ms at a repetition rate of 5 kHz/100 kHz. The burst period, or the time from one burst start to the next, is 300 ms.)
The graph in the lower is described in the document (This test requires the application of six burst frames of 10 seconds duration with 10 second pause intervals between frames (Figure 4). Table. )
2.Please tell me the Electrical fast transient immunity test IEC61000-4-4 test results in ISO7763-Q1.
Also, please tell me the voltage to become Criteria A.
3.Do you test negative surge voltage ?
If not, what is the reason ?
Please see below my inputs.
Let me know if you have any questions, thanks.
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In reply to Koteshwar Rao:
Thank you for quick response.
1. Does that mean there is 1us (1MHz) of surge during a 15ms burst ?
Not 5kHz(200us) ?
2. Does the test result change depending on the package (SOIC, SSOP) ?
3. What I was wondering is whether the "2kV on I/O lines and 4kV on power lines" mentioned above is also applicable to -2kV and -4kV.
In reply to Koji Hayashi92:
That's a good catch, this seems to be a typo in the waveform. I will correct my previous post as well..The 100ns EFT pulse should be repeated at either 5kHz or 100kHz this means that the pulse should be repeated once either every 200µs or every 10µs.
If the repetition frequency is 5kHz (1 pulse every 200µs) then the this should be repeated for 15ms, this is called burst duration. If the repetition frequency is 100kHz (1 pulse every 10µs) then it should be repeated for 0.75ms. Everything else remains the same.
I am copying below waveform timing diagram from the IEC 61000-4-4 standard to help you understand this better, thanks.
Thank you for response.
Please also answer the following two questions.
>2. Does the test result change depending on the package (SOIC, SSOP) ?
>3. What I was wondering is whether the "2kV on I/O lines and 4kV on power lines" mentioned above is also applicable to -2kV and -4kV.
Please see my input below.
2. The result shouldn't change with package and the pass levels should remain the same for both SOIC and SSOP packages..
3.. Yes, when 2kV is referred it usually means ±2kV and the same applies to all other levels on both I/O lines and power lines. TI devices are tested for both positive and negative voltages. Thanks.
I will answer to my customer.
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