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LM4050QML-SP: ELDRS and SET tests data validity and Technology

Sebastien RENAUD
Prodigy 30 points
Part Number: LM4050QML-SP

Hi,

I would like to know if the ELDRS and SET tests indicated on the TI website (LM4050WG2.5RLQV ELDRS Characterization Report Data, LM4050WG5.0RLQV ELDRS Report and LM4050WG2.5RLQV SET Report dated 11 May 2012) are still valid.

In addition, could you confirm that the technology of LM4050qml is indeed BiCMOS

Best regards

Sebastien Renaud

  • 0
    TI__Genius 17035 points
    Hello Sebastien,
    The LM4050 is on our LFAST process which is a pure junction isolated bipolar process.
    There have been no changes to the manufacturing or design of the space products since they were released. However, some parametric limits may have changed. Please refer to the datasheets or SMD for the current limits.

    TID qualificaiton is performed on every wafer at a dose rate of 10 mrad/s to 150 krad as described in the papers.

    Note that there is an indepth study on SETs under different operating conditions in IEEE TNS. It can be found with a web search:
    "Correlation of Dynamic Parameter Modification and ASET Sensitivity in a Shunt Voltage Reference"