• State TI Thinks Resolved
  • Locked Locked
  • Replies 1 reply
  • Answers 1 answer
  • Subscribers 13 subscribers
  • Views 458 views
  • Users 0 members are here
Support feedback
Options
Options
Similar topics

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

LM119QML: Radiation - Heavy Ion Test - require over-undervoltage protection due to SET?

Christoph Heilmann
Prodigy 10 points
Part Number: LM119QML
Other Parts Discussed in Thread: LM119

I found no information on SET-shape (topic: Radiation - heavy ion test) in any document (or elsewhere in literature) answering the following question:

- We use the LM119 with UB=+/-5V. The outputs are connected via pull-up resistor (2K43) to 3.3V. The output is directly connected to a FPGA without over-/undervoltage protection measure. Is it possible for the LM119 to output a SET which exceeds the maxRatings of the FPGA digital input (-0.5V...+4.1V)? If so, is there addiational information on worst-case SET-shape available?

  • 0
    TI__Genius 17115 points

    Hello Christoph,

    TI has not performed SET testing on the LM119.

    Others have done so.   If you search on the following title, you should be able to find an IEEE paper where max transients amplitudes were explored using laser testing:

    Single-Event Transient (SET) Characterization of an LM119 Voltage Comparator: An Approach to SET Model Validation Using a Pulsed Laser