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SN74AUP1G06: Output Leakage Current, SN74AUP1G06

Sornam Viswanathan V
Prodigy 130 points
Part Number: SN74AUP1G06
Other Parts Discussed in Thread: SN74AUP1G07

Hello,

I am interested in characterization data for the output leakage current of the SN74AUP1G06.  

To elaborate further, i am interested in getting data for the leakage at pin 4  of the part when the output is in high impedance state.

Any spec would help, a MIN-TYP-MAX kind of spec across temperature would be greatly appreciated.

Thanks !

Sornam

  • 0
    Guru 286100 points

    SZZA036 says it would be listed as IOZ; I'm not sure if this data exists.

    Ioff also applies to outputs; it should be similar to the IOZ value.

  • 0
    TI__Guru* 96862 points
    Hi Sornam,
    Since this device has an open-drain output (ie there is no pFET connected to the output), the leakage on the output pin is independent of the supply voltage (V_DS on the nFETs is controlled only by the applied voltage on the output pin), which means I_OZ is equal to I_off (which is tested for V_CC = 0)for this case.

    This isn't true in 100% of cases - some open drain devices merely disable the pFET, which allows leakage from that side. For the SN74AUP1G06 and SN74AUP1G07, this is definitely true. You can use I_off values for I_OZ
  • 0 in reply to Emrys Maier
    Prodigy 130 points

    Thank you, Emrys. That helps.

    I have a follow up question :

    Is it fair to assume for these devices, that the TYP value of the measured parameter (say I_OZ)  represents the average of the values measured on all units tested during characterization ?

    If yes, I would like to understand how many standard deviations (sigma) are there between the TYP (average) spec and the MIN/MAX across temperature.

    Is it reasonable to assume the following :

    MAX=TYP+6*Sigma ?

    The reason I ask is this: I am using this device in an application, where the MAX leakage at this pin would cause a system level analog parameter to go out of spec, whereas the TYP keeps it acceptable. I am trying to quantify(statistically) the spread of this phenomenon and its probability of occurrence.

    Regards,

    Sornam

  • 0 in reply to Sornam Viswanathan V
    TI__Guru* 96862 points

    Hi Sornam,

    Typical values are the average for nominal lots at room temperature.

    I'm afraid I can't release our exact testing methodology.  What I can say is that every single device that is released from TI will be within the datasheet min/max values.  Anything outside of those values is considered a yield loss and is not sold.

    In my experience, designing a system around the min/max values is the only way to ensure smooth operation over many years.

  • 0 in reply to Emrys Maier
    Prodigy 130 points

    Hi Emrys,

    Thank you very much for your help.

    I work for a large industrial OEM and I will request our TI local account management  to see if this can be released to us under our existing agreements.

    Regards,

    Sornam