Hi Team,
In one of my customer's system, Input signal to SN74AHC367 sometimes violates its absolute maximum ratings due to undershoot caused by parasitic L and high SR edge output of connected device. There is no pad to populate dump register on the signal pass, so they need to judge whether to revise the board or not.
the Observed Undershoot was around -1V peak and 5ns duration.
I have received the following question from the above background.
1. Can TI warrant that SN74AHC367 will keep same device reliability in such the short term violation?
2. If no, are there any way to estimate failure rate under the violated voltage level and duration(ex using Weibull distribution and so on)?
Regards,
Takashi Onawa