Other Parts Discussed in Thread: UNIFLASH, SYSCONFIG
Hi,
I'm currently using a TM4C1299KCZAD in my project, and I was able to successfuly program the microcontroller and run the PWM led example from TIREx after modifying it to the this part number, but after I programmed with the source of my own project, I could not establish connection to target anymore. I've read JTAG pins may be unintendedly be asserted during program run and JTAG interface is no longer accessible. So I experimented to hold reset and power up the microcontroler with reset remaining held low, and then I performed the JTAG connection Test and it was ok, here is the log:
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'Jan 31 2021'.
The library build time was '19:18:41'.
The library package version is '9.3.0.00042'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
This emulator does not create a reset log-file.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG IR Integrity scan-test has succeeded.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG DR Integrity scan-test has succeeded.
[End: Texas Instruments XDS2xx USB Debug Probe]
if I perform this test with the reset held high, this test fails.
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'Jan 31 2021'.
The library build time was '19:18:41'.
The library package version is '9.3.0.00042'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
This emulator does not create a reset log-file.
-----[An error has occurred and this utility has aborted]--------------------
This error is generated by TI's USCIF driver or utilities.
The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.
The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.
[End: Texas Instruments XDS2xx USB Debug Probe]
Is it correct to assume that the microcontroller is locked? I've also done this test for diferent JTAG clock configuration.
I've also tried using "SW mode" and tested the connection again:
-----[Print the reset-command hardware log-file]-----------------------------
This emulator does not create a reset log-file.
-----[Perform the SWD Mode Integrity test]-----------------------------------
This test will read the IDCODE register 1 time.
The IDCODE register value is 0x2ba01477.
The SWD Mode Integrity test has succeeded.
[End: Texas Instruments XDS2xx USB Debug Probe]
I notice that the IDCODE is diferent from the datasheet: 0x4BA00477 (page 221 in TM4C1299KCZAD datasheet)
I've seen the in other threads in this forum,
e2e.ti.com/.../tm4c1294ncpdt-debug-port-unlock-using-uniflash
that uniflash is used to unlock the microcontroller, but this option does not appear in my version of uniflash (version 6.2.0.3059).
Regards,
Nuno Ramos