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TMDSEMU200-U: How to test XDS200 JTAG USB Probe (Blackhawk's) indipendently and confirm JTAG Prbe is working fine?

Part Number: TMDSEMU200-U
Other Parts Discussed in Thread: TMS570LS3137, TMDS570LS31HDK

Hello All, 

Please let me know how to test independently this XDS200 JTAG USB Probe (Blackhawk's)?  

Probe is Connected via USB and recognized in Device manager. when I am trying to Test Connection I am getting this below error.

    Error connecting to the target:
    (Error -183 @ 0x0)
    The controller has detected a cable break far-from itself.
    The user must connect the cable/pod to the target.

I am not getting any TCLK at output connector TI-20 Pin Connector (TI-14 Pin Adapter is also used).

I have checked Some discussions in Forums, but not clear about this above error.

Please can i get some Assist?

Thanks and Regards,
Venugopal B
  • Hello,

    The error indicates some break in the signal between the debug probe and the target. Since it is a cable break "far". it means that the issue is somewhere on the target side where the ribbon cable of the probe connects with the jtag header on the target board. This issue is commonly due to hardware connectivity issues. 

    Please see the below link for more details:

    https://software-dl.ti.com/ccs/esd/documents/ccs_debugging_jtag_connectivity_issues.html#cable-break

    Search for the error code "183" in the document.

    Thanks

    ki

  • Hello, 

    Thank you for your response.

    We already tried the suggestion as given above link and still no improvement from Jtag Probe. 

    Even we are not getting clock (TCK) itself from Jtag and looks like its faulty.

    We are not getting the support response from Blackhawk's.

    Thanks and Regards,
    Venugopal B

  • Even we are not getting clock (TCK) itself from Jtag and looks like its faulty.

    It is likely issues with connections on the target. Do you have another probe to try?Are you using a custom board?

  • We don't have any another probe to check.

    Yes, we are using Custom Board. But before connecting to custom board we are not getting TCLK itself from JTAG and TDI also not getting. 

    Its looks line Fault on Probe. 

  • Do you have another board to try then? Even better would be if you have TI board to try on.

    What device are you using?

  • We have tried with TI board (Hercules) and its not responding. 

    We are using TMS570LS3137.

  • Is this the TI board that you tried: https://www.ti.com/tool/TMDS570LS31HDK

    John

  • Yes, we have tried with same Board and TI20 Pin converter is used, not working. 

    But it has Onboard Debugger by using USB port, by referring Schematics of this above Hercules board we have just isolated the all JTAG signals from Controller and tried to connect from Host PC, this time we are getting same error as below that we get for XDS200 USB Probe but this time we have monitored the TCK and TDI and we are able to see some signals, but we not seen this kind of response from XDS200 Probe.

        Error connecting to the target:

        (Error -183 @ 0x0)

       The controller has detected a cable break far-from itself.

       The user must connect the cable/pod to the target.

    Asper above progress from SDK Kit my understanding is XDS200 must send the some TCK and TDI to Target and it will respond accordingly.

    But no response we seen from any of the XDS200 Probe. I have seen some support links as suggested above by Ki, and no improvements I seen from probe.

     We checked with connecting the TVRef to I/O Voltage by using small Current limiting resistor and also tried with connecting TDIS to GND. (This was suggested on below link for above error code). Physically we are not seen any damage with connector or cable, we are able to read the Probe Device data through commend prompt and responding with right probe serial Number

    https://software-dl.ti.com/ccs/esd/documents/ccs_debugging_jtag_connectivity_issues.html#cable-break

    I needs to know first that why No TCK from XDS200 Probe?  

  • I am not a hardware guy so I cannot answer much about the signals but I can help us try to narrow down the issue.

    I have located a TMDS570LS31HDK board.

    If I create a target configuration and use the onboard XDS100v2 this is what I see when I test the connection:

      

    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]
    
    Execute the command:
    
    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
    
    [Result]
    
    
    -----[Print the board config pathname(s)]------------------------------------
    
    /Users/a0792138/.ti/ccs1200/0/0/BrdDat/testBoard.dat
    
    -----[Print the reset-command software log-file]-----------------------------
    
    This utility has selected a 100/110/510 class product.
    This utility will load the adapter 'libjioserdesusb.dylib'.
    The library build date was 'Jun 17 2022'.
    The library build time was '21:14:54'.
    The library package version is '9.8.0.00235'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.
    
    -----[Print the reset-command hardware log-file]-----------------------------
    
    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).
    
    -----[The log-file for the JTAG TCLK output generated from the PLL]----------
    
    There is no hardware for programming the JTAG TCLK frequency.
    
    -----[Measure the source and frequency of the final JTAG TCLKR input]--------
    
    There is no hardware for measuring the JTAG TCLK frequency.
    
    -----[Perform the standard path-length test on the JTAG IR and DR]-----------
    
    This path-length test uses blocks of 64 32-bit words.
    
    The test for the JTAG IR instruction path-length succeeded.
    The JTAG IR instruction path-length is 6 bits.
    
    The test for the JTAG DR bypass path-length succeeded.
    The JTAG DR bypass path-length is 1 bits.
    
    -----[Perform the Integrity scan-test on the JTAG IR]------------------------
    
    This test will use blocks of 64 32-bit words.
    This test will be applied just once.
    
    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.
    
    The JTAG IR Integrity scan-test has succeeded.
    
    -----[Perform the Integrity scan-test on the JTAG DR]------------------------
    
    This test will use blocks of 64 32-bit words.
    This test will be applied just once.
    
    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.
    
    The JTAG DR Integrity scan-test has succeeded.
    
    [End: Texas Instruments XDS100v2 USB Debug Probe_0]

    If I then use an XDS200 connected with a 20pin adapter this is what I see.

    Here is how my adapter is oriented.  Red line (1) is near the SD card slot.  I showed this as the ARM20 connector is not keyed so it can be put on either way.

    [Start: Texas Instruments XDS2xx USB Debug Probe_0]
    
    Execute the command:
    
    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
    
    [Result]
    
    
    -----[Print the board config pathname(s)]------------------------------------
    
    /Users/a0792138/.ti/ccs1200/0/0/BrdDat/testBoard.dat
    
    -----[Print the reset-command software log-file]-----------------------------
    
    This utility has selected a 560/2xx-class product.
    This utility will load the program 'xds2xxu.out'.
    The library build date was 'Jun 18 2022'.
    The library build time was '03:06:08'.
    The library package version is '9.8.0.00235'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '13' (0x0000000d).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.
    
    -----[Print the reset-command hardware log-file]-----------------------------
    
    This emulator does not create a reset log-file.
    
    -----[Perform the Integrity scan-test on the JTAG IR]------------------------
    
    This test will use blocks of 64 32-bit words.
    This test will be applied just once.
    
    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.
    
    The JTAG IR Integrity scan-test has succeeded.
    
    -----[Perform the Integrity scan-test on the JTAG DR]------------------------
    
    This test will use blocks of 64 32-bit words.
    This test will be applied just once.
    
    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.
    
    The JTAG DR Integrity scan-test has succeeded.
    
    [End: Texas Instruments XDS2xx USB Debug Probe_0]
    

    My XDS200 was one from Spectrum Digital but it should be the same as the Blackhawk one.

    If you are not able to get the same result on the HDK board then I would say that something is wrong with the XDS200 that you have.

    Regards,

    John

  • Dear John, 

    We have tried test connection method as you shown above but we are unable to get any response from Probe.

    We are getting below same error, we never seen any TCK signal from probe since we have referred so many discussions in E2E Forum.

        Error connecting to the target:

        (Error -183 @ 0x0)

       The controller has detected a cable break far-from itself.

       The user must connect the cable/pod to the target.

     

    We are having Blackhawk probe and we mailed to Blackhawk support team also. We never get any response from them till now.

    Thanks for your suggestion and as you said something is wrong with the XDS200 that we have, we have to initiate customer return request.

    Thanks,

    Venugopal B