Part Number: MSPM0L1305-Q1
Other Parts Discussed in Thread: MSPM0L1305
During recent high-temperature testing, we observed occasional fluctuations in the analog values sampled by the ADC of the MSPM0L1305 when the ambient temperature reached approximately 100°C (the voltage fluctuation range is about 0.02V to 0.03V). To thoroughly evaluate the impact of high temperature on ADC performance, we need your support in providing the following key parameters and data. The test conditions are as follows:
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Device: MSPM0L1305
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Temperature: 100°C (not the standard 25°C)
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Reference Voltage: External 2.5V
Could you please provide the following ADC performance parameters and curves under these conditions?
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Effective Number of Bits (ENOB) – Indicating the actual resolution of the ADC at high temperature.
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Differential Non-Linearity (DNL) – Evaluating the uniformity of the ADC's conversion steps.
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Signal-to-Noise Ratio (SNR) – Characterizing the power ratio between the signal and noise.
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ADC Transfer Function (Linearity Curve) – Showing the relationship between input voltage and output code at high temperature.
This data is crucial for us to quantify the effect of temperature on ADC accuracy and will provide a basis for subsequent calibration or design optimization. We are happy to discuss the test methodology or data format if needed.
Thank you for your support!
Best regards,