Other Parts Discussed in Thread: MSP430FR5987, SEGGER
I cannot get a XDS100V2 to debug our custom PCAssembly.
We have a custom designed PCAssembly with the TM4C1294 controller.
The board design set the footprint for the 14 pin JTAG interface connector the same as we were using for the MSP430FR5987 JTAG interface in our product.
Pin1 TDO
Pin2 VCC TOOL
Pin3 TDI
Pin4 VCC TARGET
Pin5 TMS
Pin6 no connection
Pin7 TCK
Pin8 TEST
Pin9 GND
Pin10 no connection
Pin11 nRESET
Pin12 no connection
Pin13 no connection
Pin14 no connection
We purchased a Blackhawk XDS100V2 device programmer which has a 20 pin connector wired for ARM programing. I wired up an adapter cable from the 20 ARM pinout to our 14 pin header. I will post schematic for this cable later.
[Start: Texas Instruments XDS100v2 USB Debug Probe_0]Execute the command:%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity[Result]-----[Print the board config pathname(s)]------------------------------------C:\Users\Lee\AppData\Local\TEXASI~1\CCS\ccs740\0\0\BrdDat\testBoard.dat-----[Print the reset-command software log-file]-----------------------------This utility has selected a 100- or 510-class product.This utility will load the adapter 'jioserdesusb.dll'.The library build date was 'Nov 6 2017'.The library build time was '10:36:36'.The library package version is '7.0.100.0'.The library component version is '35.35.0.0'.The controller does not use a programmable FPGA.The controller has a version number of '4' (0x00000004).The controller has an insertion length of '0' (0x00000000).This utility will attempt to reset the controller.This utility has successfully reset the controller.-----[Print the reset-command hardware log-file]-----------------------------The scan-path will be reset by toggling the JTAG TRST signal.The controller is the FTDI FT2232 with USB interface.The link from controller to target is direct (without cable).The software is configured for FTDI FT2232 features.The controller cannot monitor the value on the EMU[0] pin.The controller cannot monitor the value on the EMU[1] pin.The controller cannot control the timing on output pins.The controller cannot control the timing on input pins.The scan-path link-delay has been set to exactly '0' (0x0000).-----[The log-file for the JTAG TCLK output generated from the PLL]----------There is no hardware for programming the JTAG TCLK frequency.-----[Measure the source and frequency of the final JTAG TCLKR input]--------There is no hardware for measuring the JTAG TCLK frequency.-----[Perform the standard path-length test on the JTAG IR and DR]-----------This path-length test uses blocks of 64 32-bit words.The test for the JTAG IR instruction path-length succeeded.The JTAG IR instruction path-length is 4 bits.The test for the JTAG DR bypass path-length succeeded.The JTAG DR bypass path-length is 1 bits.-----[Perform the Integrity scan-test on the JTAG IR]------------------------This test will use blocks of 64 32-bit words.This test will be applied just once.Do a test using 0xFFFFFFFF.Scan tests: 1, skipped: 0, failed: 0Do a test using 0x00000000.Scan tests: 2, skipped: 0, failed: 0Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 0Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 0Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 0Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 0All of the values were scanned correctly.The JTAG IR Integrity scan-test has succeeded.-----[Perform the Integrity scan-test on the JTAG DR]------------------------This test will use blocks of 64 32-bit words.This test will be applied just once.Do a test using 0xFFFFFFFF.Scan tests: 1, skipped: 0, failed: 0Do a test using 0x00000000.Scan tests: 2, skipped: 0, failed: 0Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 0Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 0Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 0Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 0All of the values were scanned correctly.The JTAG DR Integrity scan-test has succeeded.[End: Texas Instruments XDS100v2 USB Debug Probe_0]Ok! Let’s Program in Debug.I then tried to program the target by pressing the Debug. I got an error.Error connecting to target. Unable to communicate with the device. Please check your connections.I pressed CancelIn the console the following: CORTEX_M4_0: Error connecting to the target: Unable to communicate with the device. Please check your connection.I am at a loss for what do do next. It passed the connection test yet reports error connecting to target in debug.