I have questions from my customer about FEE(Flash EEPROM Emulation) function.
Q1) Do we have data self-test function for memory contents inside EEPROM?
Customer expects something they can execute the test to detect broken memory bits at production line.
Q2) Suppose a broken bit is detected by the test, is there software function to hide(invalidate) the broken bit (or line) to prevent using the broken bit in application?
Thanks and regards,