F28M35H52C: Using the JTAG on the docking station to debug a F28M35

Part Number: F28M35H52C
Other Parts Discussed in Thread: TMDSCNCDH52C1, C2000WARE

Since the J2 on the F28M35 daughter card is broken. Is it possible to debug through the JTAG on the docking station?

If there is a way, what is it?

  • Yes, the JTAG signals go through the DIMM connector. I have never done it, but this should allow you to communicate to the controlCARD using the docking station's emulator.

    I wouldn't call this the standard use case but i think it should work. Please note that a few resistors are marked as DNP, so you would need to populate those. Additionally you may need to worry about contention with the embedded emulator.

    Please see the schematic located in C2000ware for full details: C:/ti/c2000/C2000Ware_4_01_00_00/boards/controlCARDs/TMDSCNCDH52C1/R_PWB_RevD/514982E_CONCERTO_DIMM100_RELEASE2_00_ALLEGRO_DEC_17_2011.pdf 

    Regards,
    Cody 

  • After doing some reasearch, I think I have to populate R40-R46, and I have to buy an external debug probe (XDS100v1, XDS100v2, XDS200, ...)? 

  • Yes please populate those resistors. No you should not need a an external debug probe as teh DIMM dock has an embedded emulator.

  • Do you mean that I only need to plug in the power for the docking station?

  • Just connect JP2 of the docking station and the USB cable can provide both power and communication though the embedded JTAG probe.

  • After I populated R40-R46 and connected the JP2 on the docking station. I tried to use the target configuration. But this is what it showed:

    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\rmml\AppData\Local\TEXASI~1\CCS\
    ccs1120\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100/110/510 class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Mar 17 2022'.
    The library build time was '15:43:48'.
    The library package version is '9.7.0.00213'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 64 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v2 USB Debug Probe_0]

  • Can you verify that the C2000 device has power? The error above most commonly happens when the debug probe is connected, but the C2000 device is not powered.

    Alternatively, it could indicate that there is a break in the JTAG chain, so for that i would recommend verifying with an Oscilloscope that the signals are propagating all the way to the C2000 device.

    Regards,
    Cody 

  • It seems that the C2000 device doesn't have power, but how am I going to give power to the device. Because after connecting R40-R46, I am not allowed to connect the Jtag port on the device.

    If the JTAG chain is broken, how am I going to verify it with a Oscilloscope? Is there an instruction for that?

    Thank you

  • The device should be recieving power from the DIMM5V0 connection. This connects to several of the pins on the docking station. Please look at TP8 of the controlCARD and see if 5V0 is present or not. 

    If 5V0 is not present please see if DIMM5V0 is available on the docking station. This depends on the position of SW1 on the docking station.

    Regards,
    Cody 

  • After connecting the JP1 (DIMM5V0) and the JP2 on the docking station, the controlCARD still doesn't work, so I measured the voltage on the card, TP8 on the card have only 3.3-3.7V and I also tried the 5V on the docking station, I only has 3.7V and the 3V3 sends 3.3V. So I suppose that I am not providing enough voltage from JP1 or the card is broken?

    I also tried to measure the voltage of the line that sends into JP1, and I got 5.1V, is that enough?

    Thanks

  • I do want to revisit your first post, Did you intend to Type "J2" is broken, or did you mean "J20" is broken? J2 is not used for JTAG, J20 is used for JTAG debugging.

    Please remove the card and see if the Voltage returns to 5V. If so your card may be damaged.

    Regards,
    Cody 

  • I made a typo, its J20 on the daughter card that is not functioning.

    After removing the card on the docking station, the 5V on docking station has 4.7V. So I assume that card is broken?

    And I tried another card, that R40-R46 haven't been populated, It shows 4.7V, but LD4 still isn't on. Should I try to populate R40-R46 on this card and try it again?

  • Hao-Yu, 

    if you have a second working controlCARD simply use the J20 debug connector. In this case there is no need to modify the controlCARD.

    Regards,
    Cody

  • Hi, 

    I have lots of controlCARD, but all of them are showing the same problem. So I am seeking a way to solve the problem.

    And I'm not the one who made all the controlCARD this, so I've no idea how were they treated before.

    Do TI have a manual that teach custumors to use the JTAG on the docking station instead of the JTAG on the daughterCARD.

    Thanks.

  • I checked the user's guide and it looks like they have the following snippet. which is similar to the guidance I have given.


    Regards,
    Cody