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TMS320F28377S-Q1: FTDI driver function bad status, no XDS100 is plugged in, invalid XDS100 serial number.

Part Number: TMS320F28377S-Q1
Other Parts Discussed in Thread: UNIFLASH, TMS320F28377S

Hi Experts,

I am not able to operate TPS92662A EVM Software.

Its LDM module contain TMS320F28377SPZPQ

Let me show the problem messages I saw.

Case1. 9 times / 10 times : “No XDS100 devices found” & “FTDI driver functions bad status”\

Uniflash - tms320f28377s.uniflash - load image (ECU_MkII_6_Chan)

So, the connectivity of driver is not good.

I saw several post in E2E like below link. But I wonder that case is same case with me.

Could you please give me any guide to solve this issue?

https://e2e.ti.com/support/microcontrollers/c2000-microcontrollers-group/c2000/f/c2000-microcontrollers-forum/21086/important----c2000-experimenter-kit-dual-rs232-fix

FTDI devices, D2xxx driver download

https://ftdichip.com/drivers/d2xx-drivers/

 

2. 1 times / 10 times

 

"Please upgrade Firmware to version 0.31 or newer."

And the accessing notification occur (behind the IT Security Policy window).

When I click access button, the IT Security Policy message occur.

Thank you.

  • Hi Dustin,

    If possible, let's try to debug in Code Composer Studio (CCS) since I am more familiar with the CCS JTAG tools than Uniflash?

    Could you post the output log from Testing Connection to your device? So when you use Code Composer Studio, open the 'Target Configuration' for the CCS Project, use the 'Test Connection' option as circled in the image below. This tests the JTAG connection to your device, and its output log may give some clues about what is going wrong beyond the error code.

    If you have access to an oscilloscope to observe the JTAG signals, you should see the same patterns as I do when I 'Test Connection', with small variability due to the specific debugger. The image below shows TDO (yellow), TMS (purple), TCK (blue), and TRST (green). This is the start of the 'Test Connection' sequence that I captured as a single sequence, triggered on the falling edge of TMS. All signals are 3.3V digital signals.

    If you zoom in more closely, you should see this same pattern at the start. 


    If your 'Test Connection' is not successful, could you post your oscilloscope captures? 

    Best Regards,

    Ben Collier

  • Thanks for your reply.

    Could you please give me additional advice?

    This is the log when I try configuration by CCS.

    TMS320F28377S was selected.

    JTAG TCLK frequency = 100KHz

    Error message 

    (Error -2131 @ 0x0) Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK). (Emulation package 9.9.0.00040) 

    Log :

    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\a0497925\AppData\Local\TEXASI~1\
    CCS\ccs1210\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100/110/510 class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Sep 20 2022'.
    The library build time was '12:28:44'.
    The library package version is '9.9.0.00040'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 64 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v2 USB Debug Probe_0]

  • This problem has been solved offline.