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LAUNCHXL-F28379D: Texas INstrument XDSxx USB Debug Probe_0 Error

Part Number: LAUNCHXL-F28379D

Tool/software:

I'm using CCS to flash code that I previously loaded to the LAUNCHXL-F28379D Launchpad device. I can no longer load code to the RAM or FLASH because of the following issue. Previously today it was working and I could read my sensor values I'm printing to the serial terminal using the terminal + screen.  Once I have attempted to flash the code, I no longer am getting that serial printout. I have tried multiple USB cables, different versions of CCS on two machines, both macos, one Intel (x86) another Apple Silicon (ARM). 

I can't figure out this error with the image attached. I have followed to the best of my ability the information on https://software-dl.ti.com/ccs/esd/documents/ccs_debugging_jtag_connectivity_issues.html regarding error 2083. I may have a gap in knowledge here, but I am not using JTAG, I am using USB from my laptop to the Launchpad USB port. 

  • Hi,

    It looks like you may have made some mistake in your Target Configuration file. The F28379D launchpad has an embedded XDS100v2 debug probe, and it looks as if you have selected XDS200.

    Please change your target configuration to use XDS100v2. 

    Best Regards,

    Ben Collier

  • Ben,

    I'm now having this issue if you would be so kind to help. 

    https://imgur.com/gallery/ccs-issue-orNlMwz

    Note the insert image button on reply is having issues. Uploaded to imgur. 

    Basically the error is now:

    Error connecting to the target:

    (Error -2131 @ 0x0)

    Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK).

    (Emulation package 9.3.0.00032)

    I have attempted to power cycle and lower TCLK. Could my hardware be failing?  

  • Hi,

    Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK).

    (Emulation package 9.3.0.00032)

    I have attempted to power cycle and lower TCLK. Could my hardware be failing?  

    Inside of your target configuration, could you please use the 'Test Connection' button? From this error log, I assume that it will pass.

    Next, could you please refer to the launchpad user guide and try putting the device into wait boot mode? 

    Then could you please follow the instructions for manually launching your target configuration and connect to your device? https://software-dl.ti.com/ccs/esd/documents/users_guide/ccs_debug-main.html#manual-launch

    Best Regards,

    Ben Collier

  • I ran test connection and the output is the following: 

    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    ~/.ti/ccs1020/0/0/BrdDat/
    testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'libjioserdesusb.dylib'.
    The library build date was 'Jan 1 2021'.
    The library build time was '13:05:24'.
    The library package version is '9.3.0.00032'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 64 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v2 USB Debug Probe_0]


  • Hi,

    From the launchpad user guide: 

    Could you please make sure that these switches are configured correctly so that the device is in wait boot mode and that TRST is connected correctly? 

    Best Regards,

    Ben Collier