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LAUNCHXL-F28027F: XDS100v2 USB Debug Problem

Mert Ecevit
Prodigy 10 points

Part Number: LAUNCHXL-F28027F
Other Parts Discussed in Thread: C2000WARE

Tool/software:

Hello, I am encountering an issue when trying to flash my F28027F C2000 MCU. During the flashing process, I receive the following error message:

Error connecting to the target: (Error -722 @ 0x0) Required dynamic library jioserdesusb could not be located. The library isn't on the search path. (Emulation package 12.8.0.00189)

I have tried reinstalling the emulation package and CCS environment is set up correctly, but the problem persists. Can anyone help me understand what might be causing this issue and how to resolve it? Any guidance would be great.

  • 0
    TI__Mastermind 36526 points

    Which version of CCS are you using? Which version of C2000WARE? 

    Thanks,

    Ben Collier

  • 0 in reply to Benjamin Collier
    Prodigy 10 points

    Hello, I'm using CCS version 12.8.0 and C2000Ware version 5.03.00.00

    Thanks,

    Mert Ecevit

  • 0 in reply to Mert Ecevit
    TI__Mastermind 36526 points

    Could you try using 12.7 and 5.02? 

    I haven't used 12.8 yet for this specific device, and I wonder if some mistake could have been made. 

    Thanks,

    Ben Collier

  • 0 in reply to Benjamin Collier
    Prodigy 10 points

    After lots of install and uninstall of CCS and C2000Ware, I encountered some other problem. When I try to verify my USB debug device it gives the log

    [Start]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\MertE\AppData\Local\TEXASI~1\CCS\
    ccs1270\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100/110/510 class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Mar 13 2024'.
    The library build time was '13:03:34'.
    The library package version is '12.7.0.00105'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 64 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-zero.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-zero.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End]



    Thanks,


    Mert Ecevit

  • +1 in reply to Mert Ecevit
    TI__Mastermind 36526 points

    Hi,

    Well, it's good to see a new error :) 

    Can you try looking at this application note? https://www.ti.com/lit/pdf/spracf0

    Are you using a TI board or your own board that you designed?

    Thanks,

    Ben Collier

  • 0 in reply to Benjamin Collier
    Prodigy 10 points

    Hello,

    The application note and its directed sources solved my problem, the failure of integrity caused by switch modes and JTAG frequency levels. I lowered frequency and opened all necessary switches according to application note. Thanks a lot Mr. Collier.


    Sincerely,

    Mert Ecevit