Dear Ti Support,
for an avionic project, I need to perform the Single Event Effect analysis for the TMS320F28332 device. This analysis shall include the Single Event Upset and the Single Event Latch-up probability when neutron particles from 1 MeV to 100 MeV interact with the device.
There is an official SEE report as a reference to be addressed to perform this analysis?
Thanks
Best Regards,
Daniel