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TMS320F28332: Single Event Effect analisys

Part Number: TMS320F28332

Dear Ti Support,

for an avionic project, I need to perform the Single Event Effect analysis for the TMS320F28332 device. This analysis shall include the Single Event Upset and the Single Event Latch-up probability when neutron particles from 1 MeV to 100 MeV interact with the device.

There is an official SEE report as a reference to be addressed to perform this analysis?

Thanks 

Best Regards,

Daniel

  • Daniel,
    The C2000 team changed the ownership of this post to the High Rel team.
    Even though this product is not a High Rel device, we support Military, Avionics and Space products predominately.

    If you are concerned about terrestrial neutrons, we do have a calculator that can estimate SER if we have appropriate data for the device. The expert that used to own this tool is no longer at TI. I will need to research to see if we have the necessary information to use this tool.

    Also, I would like you to confirm that this is the information that you are looking for.

    Regards,
    Wade
  • Hi Wade,

    yes, I'm concern about the terrestrial neutron. The Total Neutron Flux that I'm expecting is shown in this figure and it's referred to the red envelope curve

    Thanks

    Regards,

    Daniel

  • Daniel,
    For this analysis, you will need request at the following web address and submit a new support request.
    www.ti.com/csc

    If this answers your question, please click "Verify it as the answer"
    Regards,
    Wade