Other Parts Discussed in Thread: TMS320F28335
Tool/software: Code Composer Studio
Hello,
I Recently Purchased The tms320f28335 experimenter kit.
While configuring the Target configuration file for the experimenter kit (xds100 v1 onboard usb jtag selected), Test Connection window says that The JTAG IR and JTAG DR integrity scan-test failed. This is what I am getting :-
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Jun 3 2019'.
The library build time was '15:24:38'.
The library package version is '8.2.0.00004'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[The log-file for the JTAG TCLK output generated from the PLL]----------
There is no hardware for programming the JTAG TCLK frequency.
-----[Measure the source and frequency of the final JTAG TCLKR input]--------
There is no hardware for measuring the JTAG TCLK frequency.
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
This path-length test uses blocks of 64 32-bit words.
The test for the JTAG IR instruction path-length failed.
The many-ones then many-zeros tested length was -512 bits.
The many-zeros then many-ones tested length was 38 bits.
The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x035F3D89.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC4.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0x0000003F.
Test 2 Word 40: scanned out 0x00000000 and scanned in 0x00400000.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0x80F83880.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted - 68.0 percent.
The JTAG IR Integrity scan-test has failed.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 36: scanned out 0xFFFFFFFF and scanned in 0xDFFFFFFF.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 36: scanned out 0x00000000 and scanned in 0x00000020.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Test 3 Word 35: scanned out 0xFE03E0E2 and scanned in 0xFE03C0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Test 4 Word 34: scanned out 0x01FC1F1D and scanned in 0x01DC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Test 6 Word 33: scanned out 0xAACC3355 and scanned in 0xAACC3375.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 1.3 percent.
The JTAG DR Integrity scan-test has failed.
And when Debugging any program The following error shows up: "Trouble Reading Register SP: (Error -1156 @ 0x1) Device may be operating in low-power mode. Do you want to bring it out of this mode? Choose 'Yes' to force the device to wake up and retry the operation. Choose 'No' to retry the operation without waking the device. (Emulation package 8.2.0.00004)"
I did go through the XDS100 troubleshooting tips but I am not able to fix this issue.
