• State TI Thinks Resolved
  • Locked Locked
  • Replies 3 replies
  • Answers 2 answers
  • Subscribers 81 subscribers
  • Views 481 views
  • Users 0 members are here
Support feedback
Options
Options
Similar topics

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

TMS320F28377D: periodic test for IEC60730

Lu Jiang
Prodigy 25 points
Part Number: TMS320F28377D

A bit of background info. Because TI's C2000 IEC60730 SW package doesn't include 28377D, we modified software from 28069. I guess it doesn't matter much to my question.

It seems IEC60730 require periodic CRC and march test of invariable and variable memory. For real time application, we can not afford to disable all interrupts to run the memory test.

Any suggestions?

Thanks.

  • 0
    TI__Mastermind 32995 points
    Lu,

    We have a SafeTI Diagnostic Software Package for the F2837xD contains safety mechanisms to meet IEC 60730 standard.

    You can find the software library here: www.ti.com/.../iec60730swpackages

    The updated SafeTI Diagnostic Library for F2837xD modifies the APIs for March test and CRC calculation to easily allow for variable/configurable memory sizes to test at one time. This will enable you to disable your interrupts for as short or as long an amount of time which you desire and your system can handle. The F2837xD library has this improvement over the older IEC 60730 library for devices such as F2806x.

    Hope this helps.

    Regards,
    sal
  • 0 in reply to Sal Pezzino
    Prodigy 25 points

    Thank you for answering my question. It is very helpful. I have another one.

    Even I break the memory test into 100 smaller pieces, there still will be an impact to our time critical application.

    How often do I need to run this periodic test? Can I do it once per day?

    Thanks.

    Lu

  • 0 in reply to Lu Jiang
    TI__Mastermind 32995 points

    Lu,

    You can break up your memory tests, to test for example 8x 32-bits. This provides an extremely small time slice.

    The memories on F2837xD either have parity or EDAC (ECC). So the memory test may not need to be completed frequently. I am not sure how frequently you need to test your RAM memory. It may be determined by your standard.

    Please see this AR for the CPU Memory Built-In Self-Test. www.ti.com/lit/spracb9

    Hope this helps.

    sal