Hi TI,
It's said that there are test algorithms related to RAM test called "galpat" and "Abraham" alogrithms. Do you have any related codes or docs about that?
Best regards, Frank
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Hi TI,
It's said that there are test algorithms related to RAM test called "galpat" and "Abraham" alogrithms. Do you have any related codes or docs about that?
Best regards, Frank
Frank,
For the F28335 device you can download this SW package: http://www.ti.com/tool/IEC60730SWPACKAGES
There should be a SRAM test, based on the March13n algo. This should provide superior fault coverage to "GALPAT" type tests. Let me know if you have further questions.
Best,
Matthew