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TMDSRM48HDK: Radiation testing for this part

Todd Enger
Prodigy 10 points
Part Number: TMDSRM48HDK

I would like to use this part to build a radiation-hardened cubesat.  I would like to build a prototype using OpenSatKit (cFS, Cosmos and 42) as the flight software, ground system software, and testing platform.  This part is very powerful, but I have not seen any documentation as to whether it is designed for radiation-hardened applications for a cubesat that could be exposed to radiation in the GEO environment.  Could you please elaborate if any radiation testing has been done on this part (or the microcontroller itself)?

  • 0
    TI__Guru**** 186196 points
    Hi Todd,

    TI had conducted radiation exposure testong on hercules chip. The data taken on the test chips has been utilized to establish base failure rates for single event upset (SEU) on SRAM, flash, and digital logic.

    TI uses the IEC/TR 62380 model to estimate FIT rate due to silicon permanent faults.