my customer is using the MSP430FR69721IRGCR and as you know there was an errata update on the ADC67.
The proposed workaround is:
Workaround Record the calibration data by taking ADC measurements of the temperature sensor at 30C and 85C for the required reference voltage. The calibration data in the TLV section (0x1A1A - 0x1A25) can't be overwritten but the new calibration data can be stored in user FRAM or info memory for further temperature calculations.
The question is: once we measure the values on a few devices of the failing lot, can they be applied on all the other devices of the failing lot? Or should they test each device of this failing lot?
This is useful information let's say since the Workaround requires a writing in a FRAM zone currently not managed by our application so it needs SW update which is not manageable since the end application is already in the field.
Thank you and best regards,