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Look into the DS:SLAS704 at table 5.7.
Here on I_LPM4 (last row) the cumulative current of the whole device is shown when all clocks and static consumers are off.
If you look at the numbers you see that the values do not change a lot by voltage, but by temperature. Here we are talking about leakage current of the die itself. Now you are asking for the I/O as such. The I/O ring represents approx. 20-25% of the whole device. Therefore divide the values from you I_LMP4 row by 4 or 5.
The value you got comes with an +/- 6 to12dB accuracy since we just did a rough estimate.
Have a nice day