We had a project utlize TI MSP430F2132 as product controller, stored product information within the chip's B and C segments of the FLASH information storage.
After a certain test everthing was normal, two days later the product was repowered on , and it was found that the data in area B and C changed to FF (initial flash state). During the two tests, only an electrical performance test was performed on the product. However, only the D area of FLASH has been read and written in the electrical performance, and there is no read or write operation in the B and C areas. We wanna consult the possible reasons for this phenomenon.
Remark: After the problem occurs, we test the read and writing function of the FLASH's B and C area, the chip can still use normally.
我公司某项目应用了TI公司的MSP430F2132作为产品控制器,在其片内FLASH的信息存储器B段、C段存储了产品信息。
某次测试正常后,隔两天对该产品再次上电测试,发现B区、C区数据均变为FF(flash初始状态),在两次测试期间,对该产品做过一次电性能测试,但是只对FLASH的D区进行过读写操作,B区、C区无读写操作。咨询一下产生该现象可能的原因。
注:出现该问题后,对该产品FLASH的B区、C区进行读写测试,可以正常使用