We had a project utlize TI MSP430F2132 as product controller, stored product information within the chip's B and C segments of the FLASH information storage.
After a certain test everthing was normal, two days later the product was repowered on , and it was found that the data in area B and C changed to FF (initial flash state). During the two tests, only an electrical performance test was performed on the product. However, only the D area of FLASH has been read and written in the electrical performance, and there is no read or write operation in the B and C areas. We wanna consult the possible reasons for this phenomenon.
Remark: After the problem occurs, we test the read and writing function of the FLASH's B and C area, the chip can still use normally.