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MSP430FR5739-EP: Is there more backgound data available to "Total Ionizing Dose (TID) and Single Event Effects (SEE) Test Report, MCU With Embedded FRAM MSP430FR5739 epi"?

Part Number: MSP430FR5739-EP

The report from Texas I have at hand does not provide much details regarding SEU rates or cross sections, except for the SRAM were cross section is presented in Figure 3. I would like to have more datafor other parts of the device to be able to compare with another report made on non-epi version, to understand if there is any difference in SEU/SET/SEFI performance between epi and non-epi version.

BR, JTM

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