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MSP430FR2633: Captivate MCU – Phone Demo Board - noise immunity of 3V RMS IEC 61000-4-6
Part Number: MSP430FR2633
Our customer has develop trial thin system board (7 Bottoms / self-capacitance ) with MSP430DR2633 and customer is verifying Immunity tests now. Currently customer observed that this board is sometime doing erroneous detection during Electrical Fast Transient t Immunity (IEC 61000-4-4).
Regarding Hardware, customer is not able to change anything due to some reason. Therefore, customer is trying to do tuning some parameter with Captivate Design Center at this time. Customer performs Immunity test while changing the Conversion-Count, Conversion-Gain and Touch threshold, however, customer is not able to find good parameters yet. Also, customer still observed misdetection after Enabling “Noise Immunity” on Noise Immunity Tag.
Now, customer is verifying “Frequency Divider” at this time. As you know, Captivate design center has many setting parameters. Therefore, customer would like to know parameters which affects Fast Transient t Immunity test Could you elaborate it, please?
During doing t Immunity tests, Customer was not able to connect Debugger(CAPTIVATE-PGMR). Therefore, It is really appreciated if you are able to do quick comments on this.
Since I noticed the following “Tuning Check List” , I’ll share it, at first.
For EFT specifically, the primary line of defense against EFT must be hardware design. The best place to stop transients is at the power supply before they have a chance to effect different components of a product. Chances are good that the capacitive sensing MCU will not be the only component that is vulnerable to fast transients.
From the software perspective, increase the de-bounce, enable oversampling, increase the count filter beta will help with EFT. The tuning check list shows how to modify these parameters and also provide explanations of each parameters.
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In reply to Yiding Luo:
Thanks for your advices.
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