MSP430F249: Questions regarding MSP430F249_SER_r1

Hey Jonathan,

Can you request the customer send a link to the document they are referring to?  

It seems like they are asking about bit error rates which is typical in applications that are exposed to radiation, but I couldn't find any device in the MSP430F249 family with this type of testing.  We have the MSP430F249-EP enhanced product which supports a wider temperature range.  

These type of questions usually come from space applications and the only space-grade MSP430 we have is the MSP430FR5969-SP.

Thanks,

JD

Hi JD,

Thank you for your response and support.
Upon double-check for the complete part number, it is MSP430F249MPMEP (Enhanced product).

Please let me know if you need more information.

Regards,

Jonathan

Part Number: MSP430F249

Hello,

This is about the below questions of the customer regarding MSP430F249_SER_r1 :

• Is it normal we cannot change the protection setting?
• "Flash Assessment details » (Flash 100x better than SRAM) looks incorrect since FIT of Flash is 3x better than SRAM in table?
• Do you provide details by functional blocks? Or are other blocks than FLASH and SRAM not subject to SEU at all?
• Based on datasheet block diagram, looks SRAM (2k, 4k,4k,4k)) and Flash (60k, 56k, 48k, 32k) are of several blocks
• Can you also provide data for SEL?

Thank you for your support,

Ambroise

Hi JD,

let me know if we need more information.

PS miss clicked the resolve button 

Has there been an update?

Hi JD,

I would like to ask for an update on this thread.

Thanks,

Jonathan

Hey Johathan, Ambroise,

Sorry for the delay.  I'm still trying to find someone who might be able to answer these questions.  I'll give you another update by friday.     

Thanks,

JD

Hi JD,

Thank you for this update.

I understand and I will let the customer get informed of this information and we are looking forward to the updates.

Regards,

Jonathan

Hey Jonathan,

I reached out to Space and Aerospace Systems team, and the response is basically the same as I posted above.  They are also unsure of where the customer is seeing information on SEUs for MSP430F249-EP.  The only thing I can find related is this "Mean time between failures" reliability calculator but that isn't providing any of this info.  

Can you ask for a direct link to the documentation that they are referring to?

As for "SEL", Single-Event Latch-up (SEL) information is only available for TI's Space Grade products, such as the MSP430FR5969-SP.  

Thanks,

JD

Hello,

We received a file on SEU for MSP430F249_SER_r1 in June under NDA so I cannot share it on this forum.

This is better to continue on the support tool I guess for stuff under NDA.

Basically answers of the initials questions are still missing.

Can you please provide SEL data for the MSP430FR5969-SP (if they are relevant to the MSP430F249)?

Thanks

Regards

Alain

Alain,

For MSP430FR5969-SP, we have a TID RAD report here: https://www.ti.com/lit/rr/slak022/slak022.pdf?ts=1597305822772&ref_url=https%253A%252F%252Fwww.ti.com%252Fproduct%252FMSP430FR5969-SP 

But this will have no relevance on the MSP430F249 as they are completely different parts.  

Thanks,

JD

Can you reach out to your TI sales team you got the NDA and report through and have them follow up internally?  I'm not familiar with this testing at a broad level, but the team that provided the report would be able to provide any additional information if it exist.

Thanks,

JD