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DRV8353RS-EVM: ISO - F28027F JTAG issue (Error -1135)

Sidtharthan K.Ti
Prodigy 10 points
Part Number: DRV8353RS-EVM
Other Parts Discussed in Thread: DRV8353, UNIFLASH, MOTORWARE

Tool/software:

Hi team,

1) We purchased the DRV8353RS EVM package along with the ISO-F28027F(which came along with the package). Initially I have done changes in the IS0-F28027F to work stand-alone without the DRV8353RS EVM (mentioned in the DRV8353RH-EVM: ISO-F28027F in Isolation Mode - Motor drivers forum - Motor drivers - TI E2E support forums) to go-through the Code file from Motor ware . I was able to flash the program and set breakpoints in the CCS studio initially. After 20 to 30 debugging sessions, the error "Error - 1135, Debug Probe Reported an Error" occurred. After that, I was not able to debug the program from CCS and this error was seen continuously. I have checked the Switch connections (Boot switch settings set as 1-1-1) as mentioned in the Datasheet and they are fine. I can observe a mild heating in the FTDI Chip FT2232HQ in the ISO - F28027F. Is there any solution to Identify the issue?

error-1135

2) I would also like to know if changing the FTDI chip could solve the issue as mentioned in this forum XDS100v2 - Error connection to the target: (error -1135 @ 0x0) - C2000 microcontrollers forum - C2000Tm︎ microcontrollers - TI E2E support forums. In case of changing the FTDI chip, would it require separate FTDI programming from my side? 

3) I could not find any links to purchase only the Controller board (ISO-F28027F) suitable for the DRV8353Rs EVM, but I could find LaunchXL- F28027F modules that are available. Will the LaunchXL- F28027F support the DRV8353RS EVM (I could change the connectors on the Launchpad that can plug in with DRV8353 EVM)?

 

  • 0
    TI__Mastermind 22506 points

    Thanks for the questions! Since this is related to the ISO-F28027F I have reassigned the thread to the C2000 team. 

    Regards,

    Anthony Lodi

  • 0 in reply to Anthony Lodi
    TI__Mastermind 30691 points

    Hi,

    Could you take a look at this app note? https://www.ti.com/lit/pdf/spracf0

    I recommend putting the device in wait boot mode, then connecting with the manual launch steps, then erase all flash. 

    Best Regards,

    Ben Collier

  • 0 in reply to Benjamin Collier
    Prodigy 10 points

    Hi,

    I followed those instructions to connect with manual launch steps to erase all flash, the same error appears at the first steps of initiating debugging. I tried to verify the probe connection, but it failed. I also tried to erase the flash data using Uniflash tool, but the same error code pops up.

    I would also like to know if changing the FTDI chip or using the LaunchXL- F28027F board be an immediate workaround.

     

  • 0 in reply to Sidtharthan K.Ti
    TI__Mastermind 30691 points

    Hi, 

    Sidtharthan K.Ti said:
    I would also like to know if changing the FTDI chip or using the LaunchXL- F28027F board be an immediate workaround.

    I do not think that there is a problem with the FTDI chip.

    Could you try the 'Test Connection' operation? And please post you output log here.

    Best Regards,

    Ben Collier

  • 0 in reply to Benjamin Collier
    Prodigy 10 points

    Hi Benjamin, 

    Here is the output log of the 'Test Connection' operation.

    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]
 
Execute the command:
 
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
 
[Result]
 
 
-----[Print the board config pathname(s)]------------------------------------
 
C:\Users\KAIRUN~1.S\AppData\Local\TEXASI~1\

    CCS\ccs1280\0\0\BrdDat\testBoard.dat
 
-----[Print the reset-command software log-file]-----------------------------
 
This utility has selected a 100/110/510 class product.

This utility will load the adapter 'jioserdesusb.dll'.

The library build date was 'Jul 24 2024'.

The library build time was '18:57:55'.

The library package version is '12.8.0.00189'.

The library component version is '35.35.0.0'.

The controller does not use a programmable FPGA.

The controller has a version number of '4' (0x00000004).

The controller has an insertion length of '0' (0x00000000).

This utility will attempt to reset the controller.

This utility has successfully reset the controller.
 
-----[Print the reset-command hardware log-file]-----------------------------
 
The scan-path will be reset by toggling the JTAG TRST signal.

The controller is the FTDI FT2232 with USB interface.

The link from controller to target is direct (without cable).

The software is configured for FTDI FT2232 features.

The controller cannot monitor the value on the EMU[0] pin.

The controller cannot monitor the value on the EMU[1] pin.

The controller cannot control the timing on output pins.

The controller cannot control the timing on input pins.

The scan-path link-delay has been set to exactly '0' (0x0000).
 
-----[The log-file for the JTAG TCLK output generated from the PLL]----------
 
There is no hardware for programming the JTAG TCLK frequency.
 
-----[Measure the source and frequency of the final JTAG TCLKR input]--------
 
There is no hardware for measuring the JTAG TCLK frequency.
 
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
 
This path-length test uses blocks of 64 32-bit words.
 
The test for the JTAG IR instruction path-length failed.

The JTAG IR instruction scan-path is stuck-at-ones.
 
The test for the JTAG DR bypass path-length failed.

The JTAG DR bypass scan-path is stuck-at-ones.
 
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
 
This test will use blocks of 64 32-bit words.

This test will be applied just once.
 
Do a test using 0xFFFFFFFF.

Scan tests: 1, skipped: 0, failed: 0

Do a test using 0x00000000.

Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

The details of the first 8 errors have been provided.

The utility will now report only the count of failed tests.

Scan tests: 2, skipped: 0, failed: 1

Do a test using 0xFE03E0E2.

Scan tests: 3, skipped: 0, failed: 2

Do a test using 0x01FC1F1D.

Scan tests: 4, skipped: 0, failed: 3

Do a test using 0x5533CCAA.

Scan tests: 5, skipped: 0, failed: 4

Do a test using 0xAACC3355.

Scan tests: 6, skipped: 0, failed: 5

Some of the values were corrupted - 83.3 percent.
 
The JTAG IR Integrity scan-test has failed.
 
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
 
This test will use blocks of 64 32-bit words.

This test will be applied just once.
 
Do a test using 0xFFFFFFFF.

Scan tests: 1, skipped: 0, failed: 0

Do a test using 0x00000000.

Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.

The details of the first 8 errors have been provided.

The utility will now report only the count of failed tests.

Scan tests: 2, skipped: 0, failed: 1

Do a test using 0xFE03E0E2.

Scan tests: 3, skipped: 0, failed: 2

Do a test using 0x01FC1F1D.

Scan tests: 4, skipped: 0, failed: 3

Do a test using 0x5533CCAA.

Scan tests: 5, skipped: 0, failed: 4

Do a test using 0xAACC3355.

Scan tests: 6, skipped: 0, failed: 5

Some of the values were corrupted - 83.3 percent.
 
The JTAG DR Integrity scan-test has failed.
 
[End: Texas Instruments XDS100v2 USB Debug Probe_0]

  • 0 in reply to Sidtharthan K.Ti
    TI__Mastermind 30691 points

    Hi,

    So you already put the device in wait boot mode, and you are still seeing this? Did you ever use any kind of code security? Did you ever program the OTP? 

    Thanks,

    Ben Collier

  • 0 in reply to Benjamin Collier
    Prodigy 10 points

    Hi Benjamin,

    Yes, the device was in wait boot mode when the 'Test Connection' operation was performed. I haven't used any kind of code security or ever programmed OTP in the module. The only code which was flashed was the 'proj_lab05a' which was available in the motorware itself. I tried building and debugging the program by using breakpoints.

  • 0 in reply to Sidtharthan K.Ti
    TI__Mastermind 30691 points

    Hi,

    I will have to get back to you next week due to the Thanksgiving holiday.

    Best Regards,

    Ben Collier

  • 0 in reply to Benjamin Collier
    TI__Mastermind 30691 points

    Hi,

    I am very sorry about the delay, and you still experiencing this issue? 

    Thank you,

    Ben Collier

  • 0 in reply to Benjamin Collier
    Prodigy 10 points

    Yes, I am still facing the issue. Ii

  • 0 in reply to Sidtharthan K.Ti
    TI__Mastermind 30691 points

    Hi, 

    The 'Test Connection' log is valid, so the FTDI chip is fine. Also, has this switch has already been checked? This should have been in the app note. 

    If you are unable to pass 'Test Connection' even with the launchpad in wait boot mode, then it is likely that the F2802x device has been damaged.

    Best Regards,

    Ben Collier