Tool/software:
Has there been any update on the failure analysis from this forum post?
I would've commented on the thread but it appears to be locked.
Thanks
This thread has been locked.
If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.
Tool/software:
Has there been any update on the failure analysis from this forum post?
I would've commented on the thread but it appears to be locked.
Thanks
Hi Alex,
Thanks for re-starting the thread again.
I am assigning to Joshua from my team who has been supporting these devices.
Thanks,
Ibinu
Hi Alex,
I see that a final report was created for the return that you submitted. If you did not receive this final report, please let me know and I can email the report to you. This return did lead to a test coverage improvement, so the issue you reported should now be screened out.
Regards,
Joshua
Hi Joshua,
Thanks, I have not received the final report. I did not do the return, as I was not the owner of the linked thread, but I am still interested in the report if you can share it.
Is the issue you are screening for now the current limiting feature itself?
Secondly, is there a new screening cut-in date or batch number that would allow us to track which chips to avoid?
Best,
Alex
Hi Alex,
I did not check the names. I cannot share the full report if you were not the one that submitted the return. Let me check what the new test coverage implementation covers and if there is information on which chips to avoid.
Regards,
Joshua
Totally understand that you can't share the full report.
However, I believe the issues I've been seeing match up exactly with what the original poster of that linked thread came across.
If you could just provide clarity as to what spec or feature the issue was for, that would still be helpful.
At bench it was confirmed that the current was not being regulated to the ITRIP threshold which would lead the output current to hit the OCP threshold. So the ITRIP current limit feature was the item with an issue which would be targeted by the test coverage improvement.
Hi Alex,
I looked into the test coverage and I was mistaken, this coverage has not yet been implemented. The reason is, our ATE's (Automated Test Equipment) cannot use the method that the bench test used to screen out the units. Our test team is still looking into developing a method that can be used on the ATE to screen out this issue.
Regards,
Joshua
Thanks for the update. Does the automotive version of the DRV8262 (DRV8262QDDWRQ1) get tested for this ITRIP threshold?
Hi Alex,
I will check if the DRV8262DDWRQ1 screens out this issue.
Regards,
Joshua
Hi Joshua,
Have you heard back on whether the automotive version screens for ITRIP functionality yet?
Hi Alex,
I have not gotten a response on this yet. I will push to get an answer by the end of the week.
Regards,
Joshua
Hi Alex,
Sorry for not getting back with you sooner. The DRV8262-Q1 does not yet have this test coverage implemented either. We are looking over this issue to figure out a path for screening out the ITRIP issue. At this time I cannot provide a timeline for when to expect a coverage improvement to be implemented and when the devices with the improved coverage will be available.
Regards,
Joshua