I see that my original question thread has been closed. The last update I received was that a test setup was still being built up at TI. Was that test setup ever completed? Were you able to reproduce the malfunctioning gate drive behavior I demonstrated in my thread "Gate Driver Malfunction"?
I have tried all recommended actions and still have not been able to fix the behavior. I determined that disabling my PWM soft start made the malfunction much less likely to occur, but that was more of a band-aid solution. I had another unit come back from the customer with a failed Q1 again, and that reminded me to check in on the status of this thread. Without doing a complete PCB redesign, I cannot think of any other experiments to do to fix this problem.