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Original question:

BQ27546-G1: Connecting to BQ274546 directly for testing?

BQ27546-G1: BQ27546-G1 broken after short test

Star Xu
Genius 9645 points

Part Number: BQ27546-G1

Hi

The customer design with BQ27546-G1, When they do the short test at the pack side, the short voltage is higher than the setting voltage.

To solve this problem they want to add a RC filter, please recommend a suitable parameter?

  • 0
    TI__Genius 9645 points

    Hi

    Any update for this query.

    Thanks

    Star

  • 0
    TI__Genius 12215 points

    Hi, Star

        What is the word broken mean, does it mean that the device has been damaged?

       If so, a FA would be helpful to identify the root cause.

       From the wave form, the overshooting surpasses 5.5v, the maximum voltage limit at it power input, using higher cap at power and BAT input should always be good.

       But one more thing to pay attention to is the voltage on SRP and SRN during short test, the negative voltage threshold for these pins are only -0.3v, so add two schottky diodes in parallel between SRP and SRN can be tried(the 2 diodes shall not be in same direction, neither be in back to back, the anode of one diode should be connected the cathode of another diode so as to clamp the voltage low enough), also please not the Vss and SRP should be tied together to a single point, in case the voltage across this two pins surpasses the limit.

        Also the Vss and Cell- shall be connected to a single point, and the Cell- to Vss star like connection point shall be as short as possble.