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[FAQ] TPS25947: Understanding common terminologies used in eFuse datasheet

Part Number: TPS25947

Understanding common terminologies used in eFuse datasheet

  • 1. VUVLO(R) -UVLO Rising threshold: To enable device voltage at UVLO pin should be greater than VUVLO(R)

    2. VUVLO(F) -UVLO Falling threshold: To disable device voltage at UVLO pin should less than VUVLO(F)

    3. VOVLO(R) -OVLO Rising threshold: To disable device voltage at OVLO pin should be greater than VOVLO(R)

    4. VOVLO(F) -OVLO Falling threshold: To enable device voltage at OVLO pin should less than VOVLO(F)

    5. Slew rate- It is the rate at which eFuse VOUT rises with time(dVOUT/dt). eFuse device can be programmed for a particular slew rate to control the inrush current. Inrush current is the charge current drawn by load like large capacitors when supply is provided to them. For more details refer 8.3.5.1 Slew Rate (dVdt) and Inrush Current Control in TPS25947 device datasheet.

    6. Thermal Shutdown- eFuse devices have built in overtemperature protection called thermal shutdown. Events which cause high power dissipation across eFuse internal FET can make internal FET junction temperature to cross a safe threshold generally around 150C. After reaching safe threshold the FET is turned off to protect the eFuse device

    7. Auto-retry- It means that if part turns off due to fault event like thermal shutdown then it can try to start again itself. Generally device will wait for a time equal to time for junction temperature to cool down around 10C(TSDHYS) below TSD threshold plus fixed time(Thermal Shutdown Auto-Retry Interval) before it tries to restart after shutting down due to fault.

    8. Latch-off- It means that if part turns off due to fault event like thermal shutdown then it will not try to start again itself and remain off. To start part again power cycling has to be done.

    9. Current limit and Fast-trip  - eFuse devices have two overcurrent thresholds ,current limit(ILIM) and fast-trip(ISC) to provide overcurrent protection. When current through device goes above current limit but is less than fast-trip threshold in events like soft short at output, eFuse device regulates the load current to current limit known as active current-limiting . When current through device goes above fast-trip threshold in event like hard short , eFuse device regulates the current faster to a level below ILIM than the case ,ILIM<IOUT<ISC .

     

    For more details on eFuse basic functionalities , finding parts as per requirement refer below links: