Hi Team,
I am preparing a reliability report for the project and we are using multiple TI devices into the same. I am downloading the reliability data from below link-
There are two temperatures provided into the report-
- Usage temp- 55C
- Test temp- 125C
Please let us know what is difference between both of them.
Also, if FIT is 0.2 which means 0.2 failures per 1E9 device-hours. Is below statement also true?
- 0.0002 failures per 1E6 device-hours
Regards,
Aditya Kumar Singh