Other Parts Discussed in Thread: TLV62565
Hi Sir,
This is our circuit, we have some failure rate from the market, we are trying to debug, currently we doubt it seems there is a potential overshoot voltage on VIN to cause IC damaged.
Based on the measurement, you can see the VIN has overshoot and follow the PIN3 SW node, it could be through the TLV62569's body diode and cause VIN(max) higher, the overshoot voltage duration is <10ns,
sometime we can see it over 6V on VIN, is this expected or this is an issue ? If this is expected, does TI has spec or criteria of this kind of behavior on VIN ? If this is an issue, it seems a TLV62569 potential issue,
please provide your comment and suggestion.
thanks.
Conditions : Vin : 5.2V, Vout : 3.3V and 1.5V, Load : 0.4A@3.3V, 0.2A@1.5V
CH2 : TLV62569 VIN (U3.4)
CH3 : TLV62569 SW (U3.3)
CH4 : +5VE
CH1 : +5VE
CH2 : TLV62569 VIN (U3.4)
CH3 : +3.3VE
CH4 : TLV62569 SW (U3.3)