I've been looking at SLAK024 (TPS73801-SEP Single-Event Effects (SEE) Test Report) and the document appears incomplete - it references plots of the SETs observed but doesn't actually include them in the document.
I'm trying to design this component into a circuit, but the challenge I have is mitigating the SET as a transient above ~5% will destroy the parts it is supplying without any mitigation.
However, this report gives no visibility on what the transients are that need to be mitigated. More than 5% could be 7% or it could be 50%. Duration is also a concern - it would be easy to filter out a 1 ns transient but much harder if it's 10 ms for example.