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BQ27Z561: high and low temperature impact test cause TS pin damage

Part Number: BQ27Z561

Hi,  

       Customer is doing high and low temperature test on battery pack with BQ27Z561 inside.  keep in -40℃ for a few hours, then switch to 70℃ and stay for a few hours. after 10 or more circle, TS reading report error, (186℃)

and can't recover by changing  the external NTC or reset, (the wrong reading remain).

           According to datasheet, the minimum operating ambient temperature is -40. so, if any risk may damage internal circuit under such extreme temperature.  so far, in pilot run and already reported 2pcs with same problem.               

          One more observation, by changing the Rint value, the TS reading will change . by reading the TRM, the chapter 12.3.4  "Cell Temp Model" doesn't give a clear description. but this is related to  thermistor, would you please provide more information about this Model, and how to do the parameter setting? thanks.