HI Teams:
The power supply chip is broken down (between the power supply chip pin 2 and pin 1, between pin 2 and pin 5, and between pin 2 and pin 7 are broken down)
Please help to analyze where the abnormal voltage or current may cause EOS damage?
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HI Teams:
The power supply chip is broken down (between the power supply chip pin 2 and pin 1, between pin 2 and pin 5, and between pin 2 and pin 7 are broken down)
Please help to analyze where the abnormal voltage or current may cause EOS damage?
Hello,
When you say broken down, does this mean a short?
From your description of the failure, are you trying to say that U701 (LM3485) has a short between Pin 1, 2, 5, and 7?
If so, please help me understand the following:
Regards,
Jimmy
HI Jimmy:
When you say broken down, does this mean a short?
From your description of the failure, are you trying to say that U701 (LM3485) has a short between Pin 1, 2, 5, and 7?
yes.
1.ABA exchange test , the failure mode follows the IC
2.The customer has completed the production and delivered the goods to the end customer. After use, it is found that
3. Are there any visual inspections on the board that short discoloration of components?
No exception found
The customer hopes that we can analyze where abnormal voltage or current may cause EOS damage according to the schematic diagram?
If you need any additional information, please reply
Hi,
Can you tell me the part number of the input capacitor (E701)? I would recommend increasing it to a 47uF with low to moderate ESR and also perhaps a 2.2uF MLCC capacitors on the input.
If the +24V comes from a battery input, during a hot-plug event, it is possible for the input rail to surge up to 2X the input and potentially EOS the VIN and PGATE pins which would be over the absolute maximum pin rating detailed in the datasheet.
Larger input capacitance will help absorb this voltage surge.
Regards,
Jimmy