Can you please provide the measurement technique and equipment used for confirming the low noise specification (Low Noise: 30 μVRMS typical (100 Hz to 100 kHz)).
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Our Noise tests are performed all under the datasheet specifications listed.
The test is performed by powering the device using a clean input supply usually a High PSRR, low noise LDO so that the input rail is very stable and the measurement is not also picking up ac signals that are being pushed onto the LDO from the supply side. The load under test is applied, the entire setup is done in a noise box containing to isolate environmental noise pickup, then the LDO's functionality is tested to assure it is operating, finally there is an amplifier stage that is used which is powered by clean battery supplies. This makes it so the amplifier setup is very clean and does not inject noise itself onto the rail being measured. Then, placing an DC isolation capacitor at the output so only the noise from the LDO is being measured, a kelvin sense line is hooked up to the LDO output. This output goes through the DC isolation cap which leaves just the LDO noise on the output, which is then amplified and measured by the Agilent 4395A spectrum analyzer. It is swept from 10Hz to 10MHz and then the 100Hz to 100kHz band is computed to give the final uVRMS value.